TY - JOUR
T1 - High-resolution scanning tunneling microscope and its adaptation for local thermopower measurements in 2D materials
AU - Bermúdez-Perez, Jose D.
AU - Herrera-Vasco, Edwin
AU - Casas-Salgado, Javier
AU - Castelblanco, Hector A.
AU - Vega-Bustos, Karen
AU - Cardenas-Chirivi, Gabriel
AU - Herrera-Sandoval, Oscar L.
AU - Suderow, Hermann
AU - Giraldo-Gallo, Paula
AU - Galvis, Jose Augusto
N1 - Publisher Copyright:
© 2024
PY - 2024/7
Y1 - 2024/7
N2 - We present the design, fabrication and discuss the performance of a new combined high-resolution Scanning Tunneling and Thermopower Microscope (STM/SThEM). We also describe the development of the electronic control, the user interface, the vacuum system, and arrangements to reduce acoustical noise and vibrations. We demonstrate the microscope's performance with atomic-resolution topographic images of highly oriented pyrolytic graphite (HOPG) and local thermopower measurements in the semimetal Bi2Te3. Our system offers a tool to investigate the relationship between electronic structure and thermoelectric properties at the nanoscale.
AB - We present the design, fabrication and discuss the performance of a new combined high-resolution Scanning Tunneling and Thermopower Microscope (STM/SThEM). We also describe the development of the electronic control, the user interface, the vacuum system, and arrangements to reduce acoustical noise and vibrations. We demonstrate the microscope's performance with atomic-resolution topographic images of highly oriented pyrolytic graphite (HOPG) and local thermopower measurements in the semimetal Bi2Te3. Our system offers a tool to investigate the relationship between electronic structure and thermoelectric properties at the nanoscale.
UR - http://www.scopus.com/inward/record.url?scp=85190270989&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85190270989&partnerID=8YFLogxK
U2 - 10.1016/j.ultramic.2024.113963
DO - 10.1016/j.ultramic.2024.113963
M3 - Research Article
C2 - 38613941
AN - SCOPUS:85190270989
SN - 0304-3991
VL - 261
JO - Ultramicroscopy
JF - Ultramicroscopy
M1 - 113963
ER -