Estudio de los procesos hopping a través del modelo difusional en materiales nanocristalinos usados para aplicaciones fotovoltaicas

    Resultado de la investigación: Contribución a una revistaArtículorevisión exhaustiva

    Resumen

    Here, we present variable range hopping (VRH) models, nearest neighbor hopping (NNH) and potential barriers
    present at the grain boundaries, as well as mechanisms of electrical transport predominant in semiconductor
    materials for photovoltaic applications. We performed dark conductivity measures according to temperature
    for low temperature regions between 120 and 400 K in Si and Cu3BiS2 and Cu2ZnSnSe4 compounds. Using
    the percolation theory, we obtained hopping parameters and the density of states near the Fermi, N(EF) level
    for all samples. Using the approach by Mott for VRH, we obtained the diffusion model, which established
    the relationship between conductivity and density of defect states or localized gap states of the material. The
    comparative analysis between models evidenced that it is possible to obtain improvement of an order of
    magnitude in the values of each of the hopping parameters that characterize the material.
    Idioma originalEspañol
    Páginas (desde-hasta)107 - 113
    Número de páginas7
    PublicaciónUniversitas Scientiarum
    Volumen19
    N.º2
    DOI
    EstadoPublicada - 2014

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