Abstract
The cross-sectionally augmented IPS (CIPS) test of Pesaran (2007) is extended for a three-dimensional (3D) panel. This 3D-CIPS test is correctly sized. However, a bootstrapped IPS test has better power performance than the 3D-CIPS, except for high levels of cross-sectional dependency.
Original language | English (US) |
---|---|
Pages (from-to) | 188-192 |
Number of pages | 5 |
Journal | Economics Letters |
Volume | 101 |
Issue number | 3 |
DOIs | |
State | Published - Dec 2008 |
All Science Journal Classification (ASJC) codes
- Finance
- Economics and Econometrics