Reliability challenges for GaN-based FETs

M. Kuball, M. Uren, J. Pomeroy, S. Karboyan, I. Chatterjee, D. Liu, J. Anaya, T. Brazzini

Research output: Contribution to conferencePaperpeer-review

Original languageSpanish (Colombia)
DOIs
StatePublished - Jun 21 2019

Cite this