Reliability challenges for GaN-based FETs

M. Kuball, M. Uren, J. Pomeroy, S. Karboyan, I. Chatterjee, D. Liu, J. Anaya, T. Brazzini

Research output: Contribution to conference › Conference proceedings › peer-review

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TY - CONF

T1 - Reliability challenges for GaN-based FETs

AU - Kuball, M.

AU - Uren, M.

AU - Pomeroy, J.

AU - Karboyan, S.

AU - Chatterjee, I.

AU - Liu, D.

AU - Anaya, J.

AU - Brazzini, T.

PY - 2019/6/21

Y1 - 2019/6/21

UR - https://www.mendeley.com/catalogue/bf1601a1-db88-3636-ba94-5b75aa6ef689/

U2 - 10.7567/ssdm.2016.n-4-01

DO - 10.7567/ssdm.2016.n-4-01

M3 - Actas de congreso

ER -