Calculation of the optical constants of Cu3BiS3 thin films using the Wolfe method

F. Mesa, V. Ballesteros, A. Dussan

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Using the Wolfe method, we calculated the procurement of optical constants. These constants, absorption coefficient (α), refraction index of (n) and thin film thickness (d), are significant in the optical characterization of the material. We compared the Wolfe method with the method employed by R. Swanepoel. To estimate the optical constants of semiconductor thin films, we developed a constrained nonlinear programming model, based solely, on known transmission data. Ultimately, we presented a solution to this nonlinear programming model for quadratic programming. Through numerical experiments and transmittance spectral data of Cu3BiS3 thin films, we obtained values of a= 10378.34 cm-1, n = 2.4595, d =989.71 nm and Eg= 1.39 Ev, demonstrating the reliability of the proposed method.
Original languageEnglish (US)
Pages (from-to)123-131
Number of pages9
JournalUniversitas Scientiarum
DOIs
StatePublished - Jan 1 2014

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nonlinear programming
thin films
quadratic programming
procurement
data transmission
refraction
transmittance
absorptivity
film thickness
estimates

Cite this

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title = "Calculation of the optical constants of Cu3BiS3 thin films using the Wolfe method",
abstract = "Using the Wolfe method, we calculated the procurement of optical constants. These constants, absorption coefficient (α), refraction index of (n) and thin film thickness (d), are significant in the optical characterization of the material. We compared the Wolfe method with the method employed by R. Swanepoel. To estimate the optical constants of semiconductor thin films, we developed a constrained nonlinear programming model, based solely, on known transmission data. Ultimately, we presented a solution to this nonlinear programming model for quadratic programming. Through numerical experiments and transmittance spectral data of Cu3BiS3 thin films, we obtained values of a= 10378.34 cm-1, n = 2.4595, d =989.71 nm and Eg= 1.39 Ev, demonstrating the reliability of the proposed method.",
author = "F. Mesa and V. Ballesteros and A. Dussan",
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Calculation of the optical constants of Cu3BiS3 thin films using the Wolfe method. / Mesa, F.; Ballesteros, V.; Dussan, A.

In: Universitas Scientiarum, 01.01.2014, p. 123-131.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Calculation of the optical constants of Cu3BiS3 thin films using the Wolfe method

AU - Mesa, F.

AU - Ballesteros, V.

AU - Dussan, A.

PY - 2014/1/1

Y1 - 2014/1/1

N2 - Using the Wolfe method, we calculated the procurement of optical constants. These constants, absorption coefficient (α), refraction index of (n) and thin film thickness (d), are significant in the optical characterization of the material. We compared the Wolfe method with the method employed by R. Swanepoel. To estimate the optical constants of semiconductor thin films, we developed a constrained nonlinear programming model, based solely, on known transmission data. Ultimately, we presented a solution to this nonlinear programming model for quadratic programming. Through numerical experiments and transmittance spectral data of Cu3BiS3 thin films, we obtained values of a= 10378.34 cm-1, n = 2.4595, d =989.71 nm and Eg= 1.39 Ev, demonstrating the reliability of the proposed method.

AB - Using the Wolfe method, we calculated the procurement of optical constants. These constants, absorption coefficient (α), refraction index of (n) and thin film thickness (d), are significant in the optical characterization of the material. We compared the Wolfe method with the method employed by R. Swanepoel. To estimate the optical constants of semiconductor thin films, we developed a constrained nonlinear programming model, based solely, on known transmission data. Ultimately, we presented a solution to this nonlinear programming model for quadratic programming. Through numerical experiments and transmittance spectral data of Cu3BiS3 thin films, we obtained values of a= 10378.34 cm-1, n = 2.4595, d =989.71 nm and Eg= 1.39 Ev, demonstrating the reliability of the proposed method.

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